“Poorly designed surveys can be improved at the supplier level, from better matching of respondents to solving technical problems.” In his latest article for Research-Live, our CRO JD Deitch, dives into ways that surveys can be improved at a foundational level through better management on the supplier side. With respondent experience continuing to be part of the industry-wide conversation, we must all work together to ensure that respondents are engaged and treated well in order to gain quality data. 

We can keep asking “Why can’t questionnaire design keep up?”, but instead of standing on the sidelines shaking our fists, JD argues that there are issues with ‘bad’ surveys that suppliers are able to control by using new technology. In his article, he specifically covers:  

Matching respondents with the right surveys. Using automation and artificial intelligence we can start to map important data points about respondents – well beyond traditional demographics. These data points can help us to match surveys with the right respondents, and vice versa, to avoid common problems. He writes: “Technology will continue to play a big part in deploying profiling data to properly target respondents, improving the user experience and thus yielding more accurate data.”

Taking bad surveys out of field. When we step back and look at all the data we have at our fingertips, we (or the machine we’ve taught) can start to see trends and indicators when a survey is low quality. “If the data shows us an experience is dismal, we have the ability, using automation, to pull the survey out of field.” Conversely, we can also use this same data to promote good experiences and push them to the front of the line for respondents. 

JD concludes the piece with: “But with all the technology and data we have at our fingertips in today’s digital ecosystem, there’s no need to wait for survey design to improve. As suppliers, we have the ability to improve respondent experiences from multiple angles.”

For the complete article, visit: https://www.research-live.com/article/id/5059022